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Peave Главна улица Лесно да се случи ioannis voyiatzis dblp болен съм дъга умерен

PDF) Survival analysis for modeling critical events that communities may  undergo in dynamic social networks
PDF) Survival analysis for modeling critical events that communities may undergo in dynamic social networks

Education and Information Technologies | Home
Education and Information Technologies | Home

ERCIM News 96 by Peter Kunz - Issuu
ERCIM News 96 by Peter Kunz - Issuu

Education and Information Technologies | Home
Education and Information Technologies | Home

Dimitris Magos's research works | University of West Attica, Athens  (TEIATH) and other places
Dimitris Magos's research works | University of West Attica, Athens (TEIATH) and other places

PDF) Detection of Delay Faults in Memory Address Decoders
PDF) Detection of Delay Faults in Memory Address Decoders

PDF) Modeling and Simulation of Efficient March Algorithm for Memory Testing
PDF) Modeling and Simulation of Efficient March Algorithm for Memory Testing

PDF) A Context-Aware Meeting Room: Mobile Interaction and Collaboration  Using Android, Java ME and Windows Mobile
PDF) A Context-Aware Meeting Room: Mobile Interaction and Collaboration Using Android, Java ME and Windows Mobile

PDF) Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns  Generated in Universal Cellular Automata
PDF) Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata

PDF) Multimode scan: Test per clock BIST for IP cores
PDF) Multimode scan: Test per clock BIST for IP cores

PDF) A Low-Cost BIST Scheme for Test Vector Embedding in  Accumulator-Generated Sequences
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

PDF) A Closed-Loop Approach for Improving the Wellness of Low-Income Elders  at Home Using Game Consoles
PDF) A Closed-Loop Approach for Improving the Wellness of Low-Income Elders at Home Using Game Consoles

PDF) Test pattern generation based on arithmetic operations
PDF) Test pattern generation based on arithmetic operations

PDF) Concurrent Self-Test with Partially Specified Patterns For Low Test  Latency and Overhead
PDF) Concurrent Self-Test with Partially Specified Patterns For Low Test Latency and Overhead

PDF) High-Level Test Synthesis for Delay Fault Testability
PDF) High-Level Test Synthesis for Delay Fault Testability

PDF) On the Generation of Functional Test Programs for the Cache  Replacement Logic
PDF) On the Generation of Functional Test Programs for the Cache Replacement Logic

PDF) Efficient Test Compaction for Pseudo-Random Testing
PDF) Efficient Test Compaction for Pseudo-Random Testing

PDF) New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance  Faults
PDF) New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults

PDF) Delay-Insensitive Cell Matrix.
PDF) Delay-Insensitive Cell Matrix.

PDF) On the generation of pseudo-deterministic two-patterns test sequence  with LFSRs.
PDF) On the generation of pseudo-deterministic two-patterns test sequence with LFSRs.

PDF) A domain-specific approach for software development on Manycore  platforms
PDF) A domain-specific approach for software development on Manycore platforms

PDF) A Low-Cost BIST Scheme for Test Vector Embedding in  Accumulator-Generated Sequences
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences